http://www.fiblys.eu : http://cts.businesswire.com/ct/CT?id...d971cee105a943 ), this newest generation FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, ..
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